TEST GENERATION FOR ANALOG AND MIXED-SIGNAL CIRCUITS USING HYBRID SYSTEM MODELS

TEST GENERATION FOR ANALOG AND MIXED-SIGNAL CIRCUITS USING HYBRID SYSTEM MODELS

Tarik NAHHAL1 and Thao Dang2

1Department of Mathematics and Computer Science, Hassan II University, Casablanca,

2VERIMAG, 2 avenue de Vignate 32000 Gières, France 

ABSTRACT

In this paper we propose an approach for testing time-domain properties of analog and mixed-signal circuits. The approach is based on an adaptation of a recently developed test generation technique for hybrid systems and a new concept of coverage for such systems. The approach is illustrated by its application to some benchmark circuits. 

KEYWORDS

Hybrid System, Formal Methods in Conformance Testing, Analog and Mixed-Signal Circuit. 

Original Source Link : http://aircconline.com/vlsics/V2N3/2311vlsics02.pdf

http://airccse.org/journal/vlsi/vol2.html