Thursday 1 November 2018

Current Issue


Current Issue
October 2018, Volume 9, Number 5

Static Noise Margin Optimized 11nm Shorted-Gate and Independent-Gate Low Power 6T FINFET SRAM Topologies
DustenVernor, Santosh Koppa and Eugene John, University of Texas at San Antonio, USA

UVM Based Reusable Verification IP for Wishbone Compliant SPI Master Core
Lakhan Shiva Kamireddy1 and Lakhan Saiteja K2, 1University of Colorado, USA and 2Indian Institute of Technology - Kharagpur, India

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