SAF ANALYSES OF ANALOG AND MIXED SIGNAL VLSI CIRCUIT: DIGITAL TO ANALOG CONVERTER

Vaishali Dhare¹ and Usha Mehta²

¹Assistant Professor, Institute of Technology, Nirma University, Ahmedabad

² Senior Member, IEEE, Professor, Institute of Technology, Nirma University, Ahmedabad

ABSTRACT

Digital to analog converter is widely used mixed-signal circuit. Testing of analog and mixed signals faces lots of challenges due to the wide range of circuits and unavailability of one appropriate fault model. SAF (stuck_at_Fault), Stuck_open and stuck_short fault model at transistor level is used in this paper. Further these fault models are used to analyze the effects on the characteristics parameter of 3-bit R-2R DAC.

KEYWORDS

Stuck_open, Stuck_short, testing, DAC, fault.

ORIGINAL SOURCE URL: http://aircconline.com/vlsics/V6N3/6315vlsi05.pdf

VOLUME LINK: http://airccse.org/journal/vlsi/vol6.html