Test Generation for Analog and Mixed-Signal Circuits Using Hybrid System Models

Tarik NAHHAL1 and Thao Dang2, 1Hassan II University, Morocco and 2VERIMAG, France

ABSTRACT

In this paper we propose an approach for testing time-domain properties of analog and mixed-signal circuits. The approach is based on an adaptation of a recently developed test generation technique for hybrid systems and a new concept of coverage for such systems. The approach is illustrated by its application to some benchmark circuits.

KEYWORDS

Hybrid System, Formal Methods in Conformance Testing, Analog and Mixed-Signal Circuit. 

Original Source URL: https://aircconline.com/vlsics/V2N3/2311vlsics02.pdf

https://airccse.org/journal/vlsi/vol2.html

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